N.M.A. Rashid, R. Ritiikos, B.T. Goh, S.M.A. Gani, M.R. Muhamad, and S.A. Rahman. “EFFECTS OF THERMAL ANNEALING ON THE PROPERTIES OF HIGHLY REFLECTIVE Nc-Si:H a-CNx:H MULTILAYER FILMS PREPARED BY  r. F. PECVD TECHNIQUE”. Solid State Science and Technology 19, no. 1 (May 23, 2026): 132–137. Accessed July 26, 2026. https://journal.massmalaysia.org/ojs/index.php/ssst/article/view/206.