Dielectric Characterisation of Borosilicate Glass for Microwave Substrate Application

Abstract

This work aimed to extract and characterize dielectric glass powder from borosilicate glass waste for microwave substrate application. The glass powder was obtained from the glass waste using ball-milling technique and particle size of 106 µm, 90 µm, 63 µm, 45 µm, and 25 µm were prepared through the sieving method. The glass powder was then characterized for its structural and dielectric properties using X-ray diffraction method (XRD) and open-ended coaxial probe (OECP) measurement technique, respectively. The OECP measurement probe was connected to an Agilent vector network analyser for the dielectric characterization in the 1 GHz to 12 GHz frequency range. XRD patterns indicated the phase formation and purity of the borosilicate glass powder. In addition, the dielectric properties of the powder exhibited an increasing trend with particle size reduction and a decreasing pattern with frequency. At 1 GHz, the relative permittivity ( ) of the powder was 3.27, 3.28, 3.29, 3.31, and 3.33 which reduced to 3.25, 3.26, 3.27, 3.29, 3.29 at 12 GHz for 106 µm, 90 µm, 63 µm, 45 µm, and 25 µm particle size, respectively. Similarly, the loss tangent ( ) of the powder varied from 0.0034, 0.0038, 0.0041, 0.0045, and 0.0047 to 0.0029, 0.0033, 0.0038, 0.0039, and 0.0042 in the same frequency for 106 µm, 90 µm, 63 µm, 45 µm, and 25 µm particle size, respectively. Thus, the powder exhibited low dielectric properties suitable for microwave substrate application.