IMPACT OF DELTA-DOPED POSITION ON THE PERFORMANCE OF AlGaAs/InGaAs/GaAs PSEUDOMORPHIC HIGH ELECTRON MOBILITY TRANSISTOR

Authors

  • Norman Fadhil Idham Muhammad Telekom Research & Development Sdn.Bhd., Idea Tower, UPM-MTDC, Technology Incubation Center One Author
  • Ahmad Ismat Abdul Rahim Telekom Research & Development Sdn.Bhd., Idea Tower, UPM-MTDC, Technology Incubation Center One Author
  • Rasidah Sanusi Telekom Research & Development Sdn.Bhd., Idea Tower, UPM-MTDC, Technology Incubation Center One Author
  • Abdul Fatah Awang Mat Telekom Research & Development Sdn.Bhd., Idea Tower, UPM-MTDC, Technology Incubation Center One Author
  • Mohamed Razman Yahya Telekom Research & Development Sdn.Bhd., Idea Tower, UPM-MTDC, Technology Incubation Center One Author

DOI:

https://doi.org/10.66514/

Abstract

This paper reports on simulation of delta-doped AlGaAs/InGaAs/GaAs Pseudomorphic High Electron Mobility Transistors (PHEMT’s) by means of two-dimensional device simulations. The commercial two-dimensional device simulator Taurus-MEDICI was used to study the band-diagram, threshold voltage (Vth), transconductance (Gm) and cut off frequency (fT) of the PHEMT. Three different devices with single delta-doped layer located at three different positions in the pHEMT layer are simulated. The result shows that the position of delta-doped layer can be optimised to maximise the drain current, transconductance and cut-off frequency. It also can determine the device operation mode, whether as enhancement mode or depletion mode.

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Published

18-04-2026